Applied Physics B

, Volume 70, Issue 4, pp 587–591

Determination of nonlinear absorption and refraction by single Z-scan method

Authors

  • M. Yin
    • Department of Physics, National University of Singapore, Singapore 119260 (Fax: +65/777-6126, E-mail: scip7193@nus.edu.sg)
  • H.P. Li
    • Photonics Laboratory, School of EEE, Nanyang Technological University, Singapore 639789
  • S.H. Tang
    • Department of Physics, National University of Singapore, Singapore 119260 (Fax: +65/777-6126, E-mail: scip7193@nus.edu.sg)
  • W. Ji
    • Department of Physics, National University of Singapore, Singapore 119260 (Fax: +65/777-6126, E-mail: scip7193@nus.edu.sg)

DOI: 10.1007/s003400050866

Cite this article as:
Yin, M., Li, H., Tang, S. et al. Appl Phys B (2000) 70: 587. doi:10.1007/s003400050866

Abstract.

We report a simplified Z-scan technique based on a study on the symmetric features of a typical Z-scan curve. The contributions from the two-photon absorption (TPA) and the nonlinear refraction (NLR) are easily separated from a closed-aperture Z-scan curve using this method. And the determination of the two nonlinearities is simplified and unambiguous. We demonstrate this method on ZnSe, CdS, and ZnTe semiconductors with 120-fs laser pulses. And the influence from the uncertainty of the focal plane (Z=0) position is discussed. It is also found that the TPA coefficient can be obtained independently without knowing the exact location of the focal point.

PACS: 42.65.An; 78.20.Ci; 78.40.Fy

Copyright information

© Springer-Verlag 2000