Determination of nonlinear absorption and refraction by single Z-scan method
- Cite this article as:
- Yin, M., Li, H., Tang, S. et al. Appl Phys B (2000) 70: 587. doi:10.1007/s003400050866
- 831 Views
We report a simplified Z-scan technique based on a study on the symmetric features of a typical Z-scan curve. The contributions from the two-photon absorption (TPA) and the nonlinear refraction (NLR) are easily separated from a closed-aperture Z-scan curve using this method. And the determination of the two nonlinearities is simplified and unambiguous. We demonstrate this method on ZnSe, CdS, and ZnTe semiconductors with 120-fs laser pulses. And the influence from the uncertainty of the focal plane (Z=0) position is discussed. It is also found that the TPA coefficient can be obtained independently without knowing the exact location of the focal point.