Applied Physics B

, Volume 67, Issue 3, pp 283–288

Diode-laser absorption measurements of CO2, H2O, N2O, and NH3 near 2.0 μm

Authors

  • R.M. Mihalcea
    • High Temperature Gasdynamics Laboratory, Department of Mechanical Engineering, Stanford University, Stanford, CA 94305, USA
  • M.E. Webber
    • High Temperature Gasdynamics Laboratory, Department of Mechanical Engineering, Stanford University, Stanford, CA 94305, USA
  • D.S. Baer
    • High Temperature Gasdynamics Laboratory, Department of Mechanical Engineering, Stanford University, Stanford, CA 94305, USA
  • R.K. Hanson
    • High Temperature Gasdynamics Laboratory, Department of Mechanical Engineering, Stanford University, Stanford, CA 94305, USA
  • G.S. Feller
    • Focused Research, Inc. and New Focus, Inc., 2630 Walsh Avenue, Santa Clara, CA 95051, USA
  • W.B. Chapman
    • Focused Research, Inc. and New Focus, Inc., 2630 Walsh Avenue, Santa Clara, CA 95051, USA
Regular paper

DOI: 10.1007/s003400050507

Cite this article as:
Mihalcea, R., Webber, M., Baer, D. et al. Appl Phys B (1998) 67: 283. doi:10.1007/s003400050507

2

, H2O, N2O, and NH3 concentrations in various flowfields using absorption spectroscopy and extractive sampling techniques. An external-cavity diode laser with a tuning range of 1.953–2.057 μm was used to record absorption lineshapes from measured transitions in the CO22 03, ν1+2ν2 03, and 2ν13 bands, H2O ν23and ν12 bands, N2O 2ν1+4ν2 0, ν2 1+2ν3, 3ν1+2ν2 0, and 4ν1 bands, and NH3ν14 and ν34 bands. Measured CO2, H2O, and N2O survey spectra were compared to calculations to verify the HITRAN96 database and used to determine optimum transitions for species detection. Individual lineshape measurements were used to determine fundamental spectroscopic parameters including the line strength, line-center frequency, and self-broadening coefficient of the probed transition. The results represent the first measurements of CO2, H2O, N2O, and NH3 absorption near 2.0 μm using room-temperature near-IR diode lasers.

PACS: 07.07Df

Copyright information

© Springer-Verlag 1998