Applied Physics B

, Volume 65, Issue 4, pp 549–554

Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique

  • X. Zhang
  • H. Fang
  • S. Tang
  • W. Ji

DOI: 10.1007/s003400050312

Cite this article as:
Zhang, X., Fang, H., Tang, S. et al. Appl Phys B (1997) 65: 549. doi:10.1007/s003400050312

PACS: 42.65; 42.70 

Copyright information

© Springer-Verlag 1997

Authors and Affiliations

  • X. Zhang
    • 1
  • H. Fang
    • 1
  • S. Tang
    • 1
  • W. Ji
    • 1
  1. 1.Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119260SG

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