Applied Physics B

, Volume 65, Issue 4, pp 549–554

Determination of two-photon-generated free-carrier lifetime in semiconductors by a single-beam Z-scan technique

Authors

  • X. Zhang
    • Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119260
  • H. Fang
    • Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119260
  • S. Tang
    • Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119260
  • W. Ji
    • Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119260

DOI: 10.1007/s003400050312

Cite this article as:
Zhang, X., Fang, H., Tang, S. et al. Appl Phys B (1997) 65: 549. doi:10.1007/s003400050312

PACS: 42.65; 42.70

Copyright information

© Springer-Verlag 1997