Applied Physics B

, 104:735

First comparison of electric field induced second harmonic of near-infrared femtosecond laser pulses in reflection and transmission generated from Si/SiO2 interfaces of a silicon membrane

  • G. P. Nyamuda
  • E. G. Rohwer
  • C. M. Steenkamp
  • H. Stafast
Rapid communication

DOI: 10.1007/s00340-011-4682-1

Cite this article as:
Nyamuda, G.P., Rohwer, E.G., Steenkamp, C.M. et al. Appl. Phys. B (2011) 104: 735. doi:10.1007/s00340-011-4682-1

Abstract

For the first time electric field induced second harmonic (EFISH) generation of femtosecond (fs) laser pulses (λ=800 nm, τ=75±5 fs, rep. rate=80 MHz, Epulse≤10 nJ) is observed in transmission through a thin free-standing silicon (Si) membrane of 10-μm thickness and compared to the well-known EFISH results in reflection by use of the z-scan technique. EFISH in reflection and transmission unequivocally originate from the front and rear Si/SiO2 interfaces, respectively, with SiO2 being the natural oxide on the Si surfaces. Frequency conversion is enhanced by photoinduced electric fields across the Si/SiO2 interfaces caused by charge-carrier injection from Si into the oxide. The z-scan results and time-dependent measurements allow comparison of the EFISH signal amplitudes and time constants detected in transmission and reflection, demonstrating the need for further investigation.

Copyright information

© Springer-Verlag 2011

Authors and Affiliations

  • G. P. Nyamuda
    • 1
  • E. G. Rohwer
    • 1
  • C. M. Steenkamp
    • 1
  • H. Stafast
    • 2
    • 3
  1. 1.Laser Research Institute, Physics DepartmentStellenbosch UniversityMatielandSouth Africa
  2. 2.Institute of Photonic TechnologyJenaGermany
  3. 3.Faculty of Physics and AstronomyUniversity of JenaJenaGermany