First comparison of electric field induced second harmonic of near-infrared femtosecond laser pulses in reflection and transmission generated from Si/SiO2 interfaces of a silicon membrane
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- Nyamuda, G.P., Rohwer, E.G., Steenkamp, C.M. et al. Appl. Phys. B (2011) 104: 735. doi:10.1007/s00340-011-4682-1
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For the first time electric field induced second harmonic (EFISH) generation of femtosecond (fs) laser pulses (λ=800 nm, τ=75±5 fs, rep. rate=80 MHz, Epulse≤10 nJ) is observed in transmission through a thin free-standing silicon (Si) membrane of 10-μm thickness and compared to the well-known EFISH results in reflection by use of the z-scan technique. EFISH in reflection and transmission unequivocally originate from the front and rear Si/SiO2 interfaces, respectively, with SiO2 being the natural oxide on the Si surfaces. Frequency conversion is enhanced by photoinduced electric fields across the Si/SiO2 interfaces caused by charge-carrier injection from Si into the oxide. The z-scan results and time-dependent measurements allow comparison of the EFISH signal amplitudes and time constants detected in transmission and reflection, demonstrating the need for further investigation.