Atomic fluorescence mapping of optical field intensity profiles issuing from nanostructured slits, milled into subwavelength metallic layers
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- Gay, G., Viaris de Lesegno, B., Mathevet, R. et al. Appl. Phys. B (2005) 81: 871. doi:10.1007/s00340-005-2016-x
We report on a direct spatial profile measurement of optical field intensity issuing from subwavelength slits flanked by periodic grooves and fabricated on a thin metallic layer. This type of structure is of interest for the manipulation of cold atoms by optical potentials near surfaces.