Rapid communication

Applied Physics B

, Volume 81, Issue 7, pp 871-874

First online:

Atomic fluorescence mapping of optical field intensity profiles issuing from nanostructured slits, milled into subwavelength metallic layers

  • G. GayAffiliated withIRSAMC/LCAR, Université Paul Sabatier
  • , B. Viaris de LesegnoAffiliated withIRSAMC/LCAR, Université Paul SabatierLaboratoire Aimé Cotton
  • , R. MathevetAffiliated withIRSAMC/LCAR, Université Paul Sabatier
  • , J. WeinerAffiliated withIRSAMC/LCAR, Université Paul Sabatier Email author 
  • , H.J. LezecAffiliated withISIS, Université Louis PasteurThomas J. Watson Laboratories of Applied Physics, California Institute of Technology
  • , T.W. EbbesenAffiliated withISIS, Université Louis Pasteur

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We report on a direct spatial profile measurement of optical field intensity issuing from subwavelength slits flanked by periodic grooves and fabricated on a thin metallic layer. This type of structure is of interest for the manipulation of cold atoms by optical potentials near surfaces.