, Volume 81, Issue 7, pp 871-874
Date: 22 Oct 2005

Atomic fluorescence mapping of optical field intensity profiles issuing from nanostructured slits, milled into subwavelength metallic layers

Rent the article at a discount

Rent now

* Final gross prices may vary according to local VAT.

Get Access


We report on a direct spatial profile measurement of optical field intensity issuing from subwavelength slits flanked by periodic grooves and fabricated on a thin metallic layer. This type of structure is of interest for the manipulation of cold atoms by optical potentials near surfaces.