Applied Physics B

, Volume 78, Issue 6, pp 791–795

Saturation-dip measurements in the 2ν2 overtone band of OCS with a CO2-laser/microwave-sideband spectrometer

Authors

  • Z.-D. Sun
    • Canadian Institute for Photonic Innovations and Department of Physical SciencesUniversity of New Brunswick
  • Q. Liu
    • Canadian Institute for Photonic Innovations and Department of Physical SciencesUniversity of New Brunswick
    • Canadian Institute for Photonic Innovations and Department of Physical SciencesUniversity of New Brunswick
  • L.-H. Xu
    • Canadian Institute for Photonic Innovations and Department of Physical SciencesUniversity of New Brunswick
  • M.Y. Tretyakov
    • Institute of Applied PhysicsRussian Academy of Sciences
  • V.V. Dorovskikh
    • Institute of Applied PhysicsRussian Academy of Sciences
Article

DOI: 10.1007/s00340-004-1472-z

Cite this article as:
Sun, Z., Liu, Q., Lees, R. et al. Appl. Phys. B (2004) 78: 791. doi:10.1007/s00340-004-1472-z

Abstract

We have employed a CO2-laser/microwave-sideband spectrometer to carry out saturation-dip sub-Doppler measurements of a number of 2ν2 overtone transitions of OCS in the 10-μm region. The OCS frequencies have been obtained with an absolute accuracy of order ±37 kHz, as determined from a careful analysis of the combined uncertainties in the frequency of our Lamb-dip-locked laser and the centers of the observed OCS saturation signals. Our ±37 kHz measurement accuracy is consistent with literature OCS sub-Doppler data obtained on a similar instrument. The results serve to extend the comb of precise reference frequencies in the 10-μm region and to determine the magnitudes of systematic and random uncertainties of our CO2 laser.

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© Springer-Verlag 2004