Applied Physics A

, Volume 74, Supplement 1, pp s207–s209

On the possibility of using bent perfect crystals in TOF neutron scattering devices


  • P. Mikula
    • Nuclear Physics Institute, 250 68 Řež, Czech Republic
  • M. Furusaka
    • Neutron Science Laboratory, KEK, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan
  • S. Haryo
    • Faculty of Enginnering, Ibaraki University, 4-12-1 Nakanarusawa, Hitachi, Japan
  • Y. Yasushige
    • Tsukuba College of Technology, Amakubo 4-3-15, Tsukuba 305-0005, Japan

DOI: 10.1007/s003390201732

Cite this article as:
Mikula, P., Furusaka, M., Haryo, S. et al. Appl Phys A (2002) 74: s207. doi:10.1007/s003390201732


A silicon bent perfect crystal in fully asymmetric diffraction (FAD) geometry in combination with a linear position-sensitive detector can be effectively used for high-resolution analysis of a beam scattered by a sample. The results of the first promising time of flight (TOF) experimental tests of λ scanning carried out with the FAD of cylindrically bent Si slabs of different cuts are presented. The length and the homogeneous curvature of the crystal determine the range of Δλ/λ of about 10-2 that could be investigated with the accuracy of δk/k≈10-4. The obtained experimental results indicate that the FAD geometry of the bent Si slab in combination with a one-dimensional position-sensitive detector could be a good candidate for a high-resolution analyzer at some of the TOF instruments.

PACS: 61.12.Ex

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© Springer-Verlag 2002