Article

Applied Physics A

, Volume 102, Issue 3, pp 699-704

First online:

Phase transition of TiO2 thin films detected by the pulsed laser photoacoustic technique

  • A. Pérez-PachecoAffiliated withLaboratorio de Fotofísica y Películas Delgadas, Universidad Nacional Autónoma de México, CCADET-UNAM Email author 
  • , R. Castañeda-GuzmánAffiliated withLaboratorio de Fotofísica y Películas Delgadas, Universidad Nacional Autónoma de México, CCADET-UNAM
  • , C. Oliva Montes de OcaAffiliated withLaboratorio de Fotofísica y Películas Delgadas, Universidad Nacional Autónoma de México, CCADET-UNAM
  • , A. Esparza-GarcíaAffiliated withLaboratorio de Fotofísica y Películas Delgadas, Universidad Nacional Autónoma de México, CCADET-UNAM
  • , S. J. Pérez RuizAffiliated withAcústica y Vibraciones, CCADET-UNAM

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Abstract

In this work, we present characterization of titanium oxide thin films by photoacoustic measurements to determine the ablation threshold and phase transitions from amorphous to crystalline states. The important advantages of this method are that it does not require amplification at the detection stage and that it is a non-destructive technique. The correlation analysis of the photoacoustic signals allows us to visualize the ablation threshold and the phase transitions with enhanced sensitivity. This correlation analysis clearly exhibits the changes in the thin-film morphology due to controlled variations of the fluence (energy/area) and the temperature of the surrounding medium. This is particularly important for those cases where the crystalline changes caused by temperature variations need to be monitored. The thin-film samples were prepared by the sputtering technique at room temperature in the amorphous state. The phase transformations were induced by controlled temperature scanning and then corroborated with Raman spectroscopy measurements.