Applied Physics A

, Volume 102, Issue 3, pp 699–704

Phase transition of TiO2 thin films detected by the pulsed laser photoacoustic technique

  • A. Pérez-Pacheco
  • R. Castañeda-Guzmán
  • C. Oliva Montes de Oca
  • A. Esparza-García
  • S. J. Pérez Ruiz
Article

DOI: 10.1007/s00339-010-5961-0

Cite this article as:
Pérez-Pacheco, A., Castañeda-Guzmán, R., Oliva Montes de Oca, C. et al. Appl. Phys. A (2011) 102: 699. doi:10.1007/s00339-010-5961-0

Abstract

In this work, we present characterization of titanium oxide thin films by photoacoustic measurements to determine the ablation threshold and phase transitions from amorphous to crystalline states. The important advantages of this method are that it does not require amplification at the detection stage and that it is a non-destructive technique. The correlation analysis of the photoacoustic signals allows us to visualize the ablation threshold and the phase transitions with enhanced sensitivity. This correlation analysis clearly exhibits the changes in the thin-film morphology due to controlled variations of the fluence (energy/area) and the temperature of the surrounding medium. This is particularly important for those cases where the crystalline changes caused by temperature variations need to be monitored. The thin-film samples were prepared by the sputtering technique at room temperature in the amorphous state. The phase transformations were induced by controlled temperature scanning and then corroborated with Raman spectroscopy measurements.

Copyright information

© Springer-Verlag 2010

Authors and Affiliations

  • A. Pérez-Pacheco
    • 1
  • R. Castañeda-Guzmán
    • 1
  • C. Oliva Montes de Oca
    • 1
  • A. Esparza-García
    • 1
  • S. J. Pérez Ruiz
    • 2
  1. 1.Laboratorio de Fotofísica y Películas DelgadasUniversidad Nacional Autónoma de México, CCADET-UNAMMéxico D.F.Mexico
  2. 2.Acústica y VibracionesCCADET-UNAMMéxico D.F.Mexico