Applied Physics A

, Volume 94, Issue 4, pp 739–745

Electromechanical properties of lanthanum-doped lead hafnate titanate thin films for integrated piezoelectric MEMS applications

Article

DOI: 10.1007/s00339-008-5045-6

Cite this article as:
Kügeler, C., Böttger, U. & Schneller, T. Appl. Phys. A (2009) 94: 739. doi:10.1007/s00339-008-5045-6

Abstract

This paper focuses on the deposition and electromechanical characterization of lanthanum-doped lead hafnate titanate (PLHT) thin films as key material in piezoelectric microelectromechanical systems (pMEMS). PLHT (x/30/70) and PLHT(x/45/55) films with a thickness between 150 nm and 250 nm were deposited by chemical solution deposition (CSD). Thereby x varies between 0 and 10% La content. The electrical characterization shows that undoped (x=0) PLHT exhibit ferroelectric behavior similar to PZT of the same composition. La doping results in reduced ferroelectric properties and also affects the electromechanical properties. Measurements using a double beam laser interferometer yield a piezoelectric coefficient d33 of 60 pm/V, which stays constant with an increasing electric field. This leads to a linear displacement compared to undoped PLHT or conventional PZT films used for MEMS applications.

PACS

77 77.22.Ej 77.65.-j 77.65.Bn 77.84.-s 

Copyright information

© Springer-Verlag 2008

Authors and Affiliations

  1. 1.IFF, Research Centre JülichJülichGermany
  2. 2.IWE II, RWTH-AachenAachenGermany

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