, Volume 86, Issue 2, pp 197-200
Date: 07 Nov 2006

Structural characterization of shock-affected sapphire

Rent the article at a discount

Rent now

* Final gross prices may vary according to local VAT.

Get Access


The presence of dislocations has been revealed by numerical processing of high–resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 μm depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of ≃8×1012 cm-2.


81.07.-b; 96.50.Fm; 62.50.+p; 47.40.Nm; 81.40.-z