, Volume 86, Issue 2, pp 197-200
Date: 07 Nov 2006

Structural characterization of shock-affected sapphire

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Abstract

The presence of dislocations has been revealed by numerical processing of high–resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 μm depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of ≃8×1012 cm-2.

PACS

81.07.-b; 96.50.Fm; 62.50.+p; 47.40.Nm; 81.40.-z