Applied Physics A

, Volume 80, Issue 1, pp 187–194

Exploration of the ultimate patterning potential achievable with high resolution focused ion beams

  • J. Gierak
  • D. Mailly
  • P. Hawkes
  • R. Jede
  • L. Bruchhaus
  • L. Bardotti
  • B. Prével
  • P. Mélinon
  • A. Perez
  • R. Hyndman
  • J.-P. Jamet
  • J. Ferré
  • A. Mougin
  • C. Chappert
  • V. Mathet
  • P. Warin
  • J. Chapman
Article

DOI: 10.1007/s00339-004-2551-z

Cite this article as:
Gierak, J., Mailly, D., Hawkes, P. et al. Appl. Phys. A (2005) 80: 187. doi:10.1007/s00339-004-2551-z

Abstract

Controlled and reproducible fabrication of nano-structured materials will be one of the main industrial challenges in the next few years. We have recently proposed exploitation of the nano-structuring potential of a high resolution Focused Ion Beam Tool, to overcome basic limitations of current nano-fabrication techniques. The aim of this article is to present some new routes for material patterning, which benefit from ion-induced local property modifications or damage. In the experiments we describe hereafter an ultra-sharp pencil of 30 keV gallium ions is used to tailor the characteristics of several materials at a scale of a few nanometres. The experimental results are then compared to simulations. First, we simulate the control of collisional defects generated in a thin magnetic layer under FIB irradiation. The results explain the stable magnetic structures we have obtained experimentally. This was achieved with a low surface ion dose (1012 to 1014 ions/cm2). In addition we have explored the promising direction of “Bottom-up” or “self-organization” processes using a FIB instrument. We have defined artificial surface defects. These defects created by the impact of an 8-nm FWHM probe were used to pin the diffusion and to organize nanometre-sized gold clusters on a graphite surface.

Copyright information

© Springer-Verlag 2004

Authors and Affiliations

  • J. Gierak
    • 1
  • D. Mailly
    • 1
  • P. Hawkes
    • 2
  • R. Jede
    • 3
  • L. Bruchhaus
    • 3
  • L. Bardotti
    • 4
  • B. Prével
    • 4
  • P. Mélinon
    • 4
  • A. Perez
    • 4
  • R. Hyndman
    • 5
  • J.-P. Jamet
    • 5
  • J. Ferré
    • 5
  • A. Mougin
    • 5
  • C. Chappert
    • 6
  • V. Mathet
    • 6
  • P. Warin
    • 7
  • J. Chapman
    • 7
  1. 1.LPN/CNRSMarcoussisFrance
  2. 2.CEMES/CNRSToulouseFrance
  3. 3.RAITH GmbHDortmundGermany
  4. 4.DPM, UCBVilleurbanneFrance
  5. 5.Laboratoire de Physique des SolidesUMR CNRS 8502 Univ. Paris SudOrsayFrance
  6. 6.Institut d’Electronique FondamentaleUMR CNRS 8622 Univ. Paris SudOrsayFrance
  7. 7.Department of Physics and AstronomyUniv. of GlasgowGlasgowUK