, Volume 79, Issue 3, pp 707-712
Date: 23 Sep 2003

Electrical and emission properties of current-carrying silver cluster films detected by an emission electron microscope

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Silver cluster films deposited on glass or sapphire have been investigated using an emission electron microscope when a voltage was applied across the film. The electric field distribution in the silver cluster film was measured exploiting the image distortion with increasing voltage. The electron and photon emission originating from the cluster film was visualized. The latter phenomena are correlated with a deviation from Ohmic behavior of the conductivity curve.


68.37.Xy; 73.61.At; 79.90.+b