Polymer Bulletin

, Volume 46, Issue 4, pp 307–313

Crystal orientation function of poly(trimethylene terephthalate) by wide-angle x-ray diffraction

Authors

  • Hoe H. Chuah
    • Shell Chemical Company, Houston, Texas 77082, USA E-mail: hoe@shellus.com, FAX: 1-281 544 9972
  • Benjamin T. A. Chang
    • Shell Chemical Company, Houston, Texas 77082, USA E-mail: hoe@shellus.com, FAX: 1-281 544 9972

DOI: 10.1007/s002890170061

Cite this article as:
Chuah, H. & Chang, B. Polymer Bulletin (2001) 46: 307. doi:10.1007/s002890170061

Summary

A wide-angle X-ray diffraction method for measuring poly(trimethylene terephthalate) (PTT) crystal orientation function was described. It was based on Wilchinsky's treatment of uniaxial orientation. Although PTT has a low symmetry triclinic cell only one equatorial reflection is needed for the measurement because the unit cell β-angle happened to be 90°, and there is a strong 010 reflection. The choice of unit cell parameters from the conflicting literature data and the reduction of Wilchinsky's equation into a simple form allowing the measurement of only one reflection were presented. The discrepancies between literature wide-angle X-ray and electron diffraction unit cell volumes and crystal densities were also discussed.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2001