Clustering among loci underlying soybean resistance to Fusarium solani, SDS and SCN in near-isogenic lines
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- Meksem, K., Doubler, T., Chancharoenchai, K. et al. Theor Appl Genet (1999) 99: 1131. doi:10.1007/s001220051317
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In the soybean [Glycine max (L.) Merr.] cultivar ’Forrest’ a single chromosomal region underlies co-inheritance of field resistance of the sudden-death syndrome (SDS), caused by the fungus Fusarium solani (Mart.) Sacc. f. sp. glycines (Burk.) Snyd. & Hans. and soybean cyst nematode (SCN) race 3 (caused by Heterodera glycines Ichinohe). Our objectives were to verify that co-inheritance was derived from a single chromosomal region in near-isogenic lines and to separate component gene clusters. DNA markers were compared with a SDS leaf-scorch index (DX), F. solani root-infection severity (IS) and a SCN index of parasitism (IP) among 80 near-isogenic lines (NILs). The genomic region identified by the RFLP marker Bng122D was strongly associated (0.0004 ≤P≤ 0.006) with mean SDS DX (R2 > 16–38%) and IS (R2 > 38–73%), but only marginally associated with resistance to SCN. However, the linked (4.3–7.4 cM) microsatellite marker SATT309 was strongly associated with both resistance to SCN (0.0001 ≤P≤ 0.0003; R2 > 24–97%) and mean leaf DX (0.0001 ≤P≤ 0.0003; R2 > 25–63%), but not root IS. Recombination events among markers and traits enabled separation of the qualitative loci underlying resistance to SDS and SCN. Our data showed that resistance to SDS DX, SDS IS and SCN IP in Forrest may be caused by four genes in a cluster with two pairs in close linkage or by a two-gene cluster with each gene displaying pleiotropy, one conditioning SDS IS and DX and the other SCN IP and SDS DX.