Il Nuovo Cimento D

, Volume 19, Issue 2, pp 545–552

Regimes of X-ray phase-contrast imaging with perfect crystals

Authors

  • T. E. Gureyev
    • CSIRODivision of Materials Science and Technology
  • S. W. Wilkins
    • CSIRODivision of Materials Science and Technology
Article

DOI: 10.1007/BF03041015

Cite this article as:
Gureyev, T.E. & Wilkins, S.W. Nouv Cim D (1997) 19: 545. doi:10.1007/BF03041015

Summary

Perfect crystals have recently been used as X-ray wavefront analysers to help produce phase-contrast images of non-periodic objects. Such images are essentially the maps of the phase gradients introduced in a plane X-ray wave upon passage through a weakly absorbing object. We show that the nature of the contrast in the images is determined by the ratio between the local wavefront curvature and the width of the crystal rocking curve. Depending on this ratio being small or large, two quite distinct regimes for image formation can be identified, namely the differential phase-contrast mode and the refractometric mode. We derive simple analytical formulae which can be used for the analysis of X-ray images of phase objects obtained in these two regimes.

PACS

61.10 X-ray diffraction and scattering

PACS

01.30.Cc Conference proceedings

Copyright information

© Società Italiana di Fisica 1997