Metallurgical Transactions A

, Volume 24, Issue 4, pp 819–831

Orientation imaging: The emergence of a new microscopy

  • Brent L. Adams
  • Stuart I. Wright
  • Karsten Kunze
Mechenical Behaviour

DOI: 10.1007/BF02656503

Cite this article as:
Adams, B.L., Wright, S.I. & Kunze, K. MTA (1993) 24: 819. doi:10.1007/BF02656503

Abstract

A new microscopy, called orientation imaging microscopy, is described. Imaging results from precise measurements of local lattice orientation facilitated by backscattered Kikuchi diffraction. The hardware configuration of the microscope is described, and a formal description of image formation is developed. Application of the method to several cubic materials and material conditions is described. Emphasis is given to those areas of application where new insight into polycrystalline microstructures has begun to emerge.

Copyright information

© The Minerals, Metals and Materials Society, and ASM International 1993

Authors and Affiliations

  • Brent L. Adams
    • 1
  • Stuart I. Wright
    • 2
  • Karsten Kunze
    • 1
  1. 1.Department of Manufacturing Engineering and Engineering of TechnologyBrigham Young UniversityProvo
  2. 2.Los Alamos National LaboratoryLos Alamos