, Volume 24, Issue 4, pp 819-831

Orientation imaging: The emergence of a new microscopy

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Abstract

A new microscopy, called orientation imaging microscopy, is described. Imaging results from precise measurements of local lattice orientation facilitated by backscattered Kikuchi diffraction. The hardware configuration of the microscope is described, and a formal description of image formation is developed. Application of the method to several cubic materials and material conditions is described. Emphasis is given to those areas of application where new insight into polycrystalline microstructures has begun to emerge.