Journal of Electronic Materials

, Volume 17, Issue 3, pp 229–237

Deposition, post-deposition annealing, and characterization of epitaxial Ge films grown on Si(100) by pyrolysis of GeH4

  • M. L. Green
  • Y. S. Ali
  • D. Brasen
  • S. Nakahara
Article

DOI: 10.1007/BF02652183

Cite this article as:
Green, M.L., Ali, Y.S., Brasen, D. et al. JEM (1988) 17: 229. doi:10.1007/BF02652183

Abstract

As a first step towards developing heterostructures such as GaAs/Ge/Si entirely by chemical vapor deposition, Ge films have been deposited on (100) Si by the pyrolysis of GeH4. The best films are grown at 700° C and are planar and specular, with RBS minimum channeling yields of ≈4.0% (near the theoretical value) and defect densities of 1.3 x 108 cm−2. Variations of in-situ cleaning conditions, which affect the nature of the Si substrate surface, greatly affect the ability to get good epitaxial growth at 700° C. The majority of the defects found in the Ge films are extrinsic stacking faults, formed by dissociation of misfit and thermal expansion accommodation dislocations. The stacking fault density is not significantly reduced by post-deposition annealing, as is the case for the dislocations observed in MBE Ge films. It is suggested that lowering the CVD growth temperature through the use of high vacuum deposition equipment would result in dislocation defects like those of MBE films which could then be annealed more effectively than stacking faults. Films with defect densities equivalent to MBE Ge films (~2 x 107 cm−2) could then probably be produced.

Key words

Ge films grown on Si CVD dislocations 

Copyright information

© The Metallurgical of Society of AIME 1988

Authors and Affiliations

  • M. L. Green
    • 1
  • Y. S. Ali
    • 1
  • D. Brasen
    • 1
  • S. Nakahara
    • 1
  1. 1.AT&T Bell LaboratoriesMurray Hill

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