International Journal of Thermophysics

, Volume 18, Issue 2, pp 459–469

Measurements of thermophysical properties of molten silicon by a high-temperature electrostatic levitator

  • W. K. Rhim
  • S. K. Chung
  • A. J. Rulison
  • R. E. Spjut
Article

DOI: 10.1007/BF02575175

Cite this article as:
Rhim, W.K., Chung, S.K., Rulison, A.J. et al. Int J Thermophys (1997) 18: 459. doi:10.1007/BF02575175

Abstract

Several thermophysical properties of molten silicon measured by the high-temperature electrostatic levitator at JPL are presented. They are density, constant-pressure specific heat capacity, hemispherical total emissivity, and surface tension. Over the temperature range investigated (1350<Tm<1825 K), the measured liquid density (in g·cm−3) can be expressed by a quadratic function,p(T)=pm−1.69×10−4(T−Tm)−1.75×10−7(T−Tm)2 withTm andpm being 1687 K and 2.56 g·cm−3, respectively. The hemispherical total emissivity of molten silicon at the melting temperature was determined to be 0.18, and the constant-pressure specific heat was evaluated as a function of temperature. The surface tension (in 10−3 N·m−1) of molten silicon over a similar temperature range can be expressed by σ(T)=875–0.22(T−Tm).

Key Words

densityelectrostatic levitationhemispherical total emissivitymolten siliconspecific heatsurface tension

Copyright information

© Plenum Publishing Corporation 1997

Authors and Affiliations

  • W. K. Rhim
    • 1
  • S. K. Chung
    • 1
  • A. J. Rulison
    • 1
  • R. E. Spjut
    • 3
  1. 1.Jet Propulsion LaboratoryCalifornia Institute of TechnologyPasadenaUSA
  2. 2.Space Systems/LoralPalo AltoUSA
  3. 3.Department of EngineeringHarvey Mudd CollegeClaremontUSA