Measurement of electrodynamic parameters of superconducting films in the far-infrared and submillimeter frequency ranges

  • B. P. Gorshunov
  • G. V. Kozlov
  • A. A. Volkov
  • S. P. Lebedev
  • I. V. Fedorov
  • A. M. Prokhorov
  • V. I. Makhov
  • J. Schützmann
  • K. F. Renk
Article

DOI: 10.1007/BF02209275

Cite this article as:
Gorshunov, B.P., Kozlov, G.V., Volkov, A.A. et al. Int J Infrared Milli Waves (1993) 14: 683. doi:10.1007/BF02209275

Abstract

Possibilities of determing the complex conductivity of thin super-conducting films using far-infrared and submillimeter reflectivity and transmissivity techniques are discussed. It is shown that within the framework of standard approaches a satisfactory accuracy is available only for the imaginary part of the conductivity (dielectric permittivity). Different resonator methods are suggested for measuring the real part of the conductivity. Data for superconducting NbN films at frequencies 3 – 25 cm−1 are presented.

Key words

Superconducting thin films far-infrared and submillimeter waves optical constants 

Copyright information

© Plenum Publishing Corporation 1993

Authors and Affiliations

  • B. P. Gorshunov
    • 1
  • G. V. Kozlov
    • 1
  • A. A. Volkov
    • 1
  • S. P. Lebedev
    • 1
  • I. V. Fedorov
    • 1
  • A. M. Prokhorov
    • 1
  • V. I. Makhov
    • 2
  • J. Schützmann
    • 3
  • K. F. Renk
    • 3
  1. 1.General Physics InstituteUSSR Academy of SciencesMoscowRussia
  2. 2.Research Institute of Physical ProblemsMoscowRussia
  3. 3.Institut für Angewandte PhysikUniversität RegensburgRegensburgGermany

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