Optical and Quantum Electronics

, Volume 21, Issue 4, pp 253–282

Optical methods for precision measurements

An invited paper
  • H. J. Tiziani
Tutorial Review

DOI: 10.1007/BF02027299

Cite this article as:
Tiziani, H.J. Opt Quant Electron (1989) 21: 253. doi:10.1007/BF02027299

Abstract

Contactless measuring techniques are becoming increasingly important for industrial applications. The use of a laser, solid-state detector arrays and powerful small computers leads to a very efficient fringe analysis in holography as well as in Moiré and speckle techniques. Due to the computer analysis, much more information can be extracted from interferograms, leading to higher sensitivities and accuracies. The application of different fringe analysis procedures is discussed, together with some potentials of the application of interferometry, holography, and speckle and Moiré techniques.

Copyright information

© Chapman and Hall Ltd. 1989

Authors and Affiliations

  • H. J. Tiziani
    • 1
  1. 1.University of Stuttgart, Institut für Technische OptikStuttgart 80Germany