Metrika

, Volume 29, Issue 1, pp 103–113

Optimal tests and estimators for truncated exponential families

  • M. A. Beg
Article

DOI: 10.1007/BF01893370

Cite this article as:
Beg, M.A. Metrika (1982) 29: 103. doi:10.1007/BF01893370

Abstract

Blackwell-Rao-Lehmann-Scheffe' theory is used to derive the minimum variance unbiased estimators for the functions of scale and truncation parameters as well as the reliability function of the truncated exponential family distribution. Uniformly most powerful unbiased tests of hypotheses are formulated. Finally, a particular model of this family, viz., the truncated exponential model is discussed.

Copyright information

© Physica-Verlag 1982

Authors and Affiliations

  • M. A. Beg
    • 1
  1. 1.Institute of StatisticsUniversity of the Punjab (New Campus)LahorePakistan