Czechoslovak Journal of Physics B

, Volume 18, Issue 6, pp 801–806

Thin oxide films on germanium

  • J. Sládková
Article

DOI: 10.1007/BF01696142

Cite this article as:
Sládková, J. Czech J Phys (1968) 18: 801. doi:10.1007/BF01696142

Abstract

The optical constants, i.e. the refractive index and thickness, were determined for thin oxide films which were produced by heating single-crystal samples of germanium to temperatures ranging from 450° C to 600° C. The ellipsometric method was used to determine the thicknesses and the refractive indices of the films.

Copyright information

© Academia, nakladatelství Československé akademie věd 1968

Authors and Affiliations

  • J. Sládková
    • 1
  1. 1.Electrotechnical FacultyTechnical UniversityBrnoCzechoslovakia