Rapid Communications

Applied Physics A

, Volume 60, Issue 5, pp 523-524

Note on the interpretation of injection-level-dependent surface recombination velocities

  • R. BrendelAffiliated withMax-Planck-Institut für Festkörperforschung

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Abstract

The surface recombination velocityS=U/n is defined as the ratio between the surface recombination current densityU and the excess minority carrier concentrationn at the semiconductor surface. Measurements of injection-dependent surface recombination velocities apply modulation techniques, and thus, in reality, a differential surface recombination velocityS diff=dU/dn is determined. The significance to distinguishS andS diff when evaluating measurements is shown.

PACS

73.40