Journal of Materials Science

, Volume 22, Issue 4, pp 1437–1442

The yield behaviour of amorphous polyethylene terephthalate: An activated rate theory approach

Authors

  • J. S. Foot
    • Department of PhysicsUniversity of Leeds
  • R. W. Truss
    • Department of PhysicsUniversity of Leeds
  • I. M. Ward
    • Department of PhysicsUniversity of Leeds
  • R. A. Duckett
    • Department of PhysicsUniversity of Leeds
Papers

DOI: 10.1007/BF01233145

Cite this article as:
Foot, J.S., Truss, R.W., Ward, I.M. et al. J Mater Sci (1987) 22: 1437. doi:10.1007/BF01233145

Abstract

Yield-stress measurements on amorphous polyethylene terephthalate film are presented covering five decades of strain rate at temperatures from just below the glass transition (≈ 60° C) to −160° C. The data were obtained by combining measurements from a conventional Instron machine with data from a high-speed tensile tester capable of applying strain rates of up to 50 sec−1. Five different failure modes have been identified over this extensive range of test conditions. All data from tests which show a clear yield point can be described accurately by an extension of the Ree Eyring approach to include two processes. The process which is only important at low temperatures correlates well with theβ-process observed in dynamic mechanical experiments.

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Copyright information

© Chapman and Hall Ltd 1987