Journal of Low Temperature Physics

, Volume 64, Issue 3, pp 235–268

Experimental survey of chaos in the Josephson effect

  • C. Noeldeke
  • R. Gross
  • M. Bauer
  • G. Reiner
  • H. Seifert
Article

DOI: 10.1007/BF00685131

Cite this article as:
Noeldeke, C., Gross, R., Bauer, M. et al. J Low Temp Phys (1986) 64: 235. doi:10.1007/BF00685131

Abstract

The range of chaotic behavior in the Josephson effect is investigated experimentally in tin tunnel junctions and indium microbridges subjected to dc and rf bias. Chaos is found to occur between frequencies of 0.1/(2πRC) and the plasma frequency at intermediate hysteresis. The low-hysteresis onset of chaos is studied systematically by varying the critical current of an Sn/ox/Sn tunnel junction as a function of temperature. The results agree with simulations and theoretical predictions.

Copyright information

© Plenum Publishing Corporation 1986

Authors and Affiliations

  • C. Noeldeke
    • 1
  • R. Gross
    • 1
  • M. Bauer
    • 1
  • G. Reiner
    • 1
  • H. Seifert
    • 1
  1. 1.Physikalisches Institut IIUniversität TübingenTübingenWest Germany