Journal of Materials Science Letters

, Volume 15, Issue 19, pp 1727–1729

Surface analysis of doped lanthanide cobalt perovskites by X-ray photoelectron spectroscopy

  • V. Kozhukharov
  • M. Machkova
  • P. Ivanov
  • H. J. M. Bouwmeester
  • R. van Doorn
Article

DOI: 10.1007/BF00636208

Cite this article as:
Kozhukharov, V., Machkova, M., Ivanov, P. et al. J Mater Sci Lett (1996) 15: 1727. doi:10.1007/BF00636208

Copyright information

© Chapman & Hall 1996

Authors and Affiliations

  • V. Kozhukharov
    • 1
  • M. Machkova
    • 1
  • P. Ivanov
    • 2
  • H. J. M. Bouwmeester
    • 3
  • R. van Doorn
    • 3
  1. 1.University of Chemical Technology and MetallurgySofiaBulgaria
  2. 2.Laboratory for Surface AnalysisDZU-DMONStara ZagoraBulgaria
  3. 3.Laboratory for Inorganic Materials Science, Faculty of Chemical TechnologyUniversity of TwenteEnschedeThe Netherlands

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