Journal of Materials Science Letters

, Volume 12, Issue 10, pp 721–723

The refractive index of InP and its oxide measured by multiple-angle incident ellipsometry

Authors

  • Tien Sheng Chao
    • Department of Electronics and Engineering and Institute of ElectronicsNational Chiao Tung University
  • Chung Len Lee
    • Department of Electronics and Engineering and Institute of ElectronicsNational Chiao Tung University
  • Tan Fu Lei
    • Department of Electronics and Engineering and Institute of ElectronicsNational Chiao Tung University
Article

DOI: 10.1007/BF00626698

Cite this article as:
Sheng Chao, T., Lee, C.L. & Lei, T.F. J Mater Sci Lett (1993) 12: 721. doi:10.1007/BF00626698
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© Chapman & Hall 1993