Journal of Materials Science Letters

, Volume 12, Issue 10, pp 721–723

The refractive index of InP and its oxide measured by multiple-angle incident ellipsometry

  • Tien Sheng Chao
  • Chung Len Lee
  • Tan Fu Lei
Article

DOI: 10.1007/BF00626698

Cite this article as:
Sheng Chao, T., Lee, C.L. & Lei, T.F. J Mater Sci Lett (1993) 12: 721. doi:10.1007/BF00626698

Copyright information

© Chapman & Hall 1993

Authors and Affiliations

  • Tien Sheng Chao
    • 1
  • Chung Len Lee
    • 1
  • Tan Fu Lei
    • 1
  1. 1.Department of Electronics and Engineering and Institute of ElectronicsNational Chiao Tung UniversityHsinchuTaiwan