Blackett Laboratory, Physics DepartmentImperial College
Cite this article as:
Ouchi, K. Opt Quant Electron (1980) 12: 237. doi:10.1007/BF00620041
We examine the statistical properties of speckle patterns produced at an arbitrary axial point of a telecentric imaging system having a soft and hard-edged aperture. Expressions for the contrast of the pattern ar derived and discussed.