Optical and Quantum Electronics

, Volume 12, Issue 3, pp 237–243

Statistics of image plane speckle

  • K. Ouchi

DOI: 10.1007/BF00620041

Cite this article as:
Ouchi, K. Opt Quant Electron (1980) 12: 237. doi:10.1007/BF00620041


We examine the statistical properties of speckle patterns produced at an arbitrary axial point of a telecentric imaging system having a soft and hard-edged aperture. Expressions for the contrast of the pattern ar derived and discussed.

Copyright information

© Chapman and Hall Ltd 1980

Authors and Affiliations

  • K. Ouchi
    • 1
  1. 1.Blackett Laboratory, Physics DepartmentImperial CollegeLondonUK

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