Abstract
Two AIN-SiO2 materials have been investigated by means of electron microscopy; fracture toughness has been used to characterize both materials. Three new long-period polytypes, close to the 2H hexagonal AIN structure, have been identified by high-resolution electron microscopy, namely 33R, 24H and 39R. These polytypes are built on the same stacking principle as those in the previously observed shorter polytypes in the AIN system. Indentation measurements indicate similar hardness and toughness for the different polytypes in these ceramics.
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Van Tendeloo, G., Faber, K.T. & Thomas, G. Characterization of AIN ceramics containing long-period polytypes. J Mater Sci 18, 525–532 (1983). https://doi.org/10.1007/BF00560642
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DOI: https://doi.org/10.1007/BF00560642