Journal of Materials Science

, Volume 20, Issue 12, pp 4459–4464

Residual stresses of thin, short rectangular plates

Authors

  • Arsavir T. Andonian
    • Department of Civil Engineering, Mechanics and MetallurgyUniversity of Illinois at Chicago
  • Steven Danyluk
    • Department of Civil Engineering, Mechanics and MetallurgyUniversity of Illinois at Chicago
Papers

DOI: 10.1007/BF00559335

Cite this article as:
Andonian, A.T. & Danyluk, S. J Mater Sci (1985) 20: 4459. doi:10.1007/BF00559335

Abstract

The analysis of the residual stresses in thin, short rectangular plates is presented. The analysis is used in conjunction with a shadow Moiré interferometry technique by which residual stresses are obtained over a large spatial area from a strain measurement. The technique and analysis are applied to a residual stress measurement of polycrystalline silicon sheet grown by the edge-defined film growth technique.

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Copyright information

© Chapman and Hall Ltd. 1985