Applied Physics A

, Volume 59, Issue 2, pp 89–101

Scanning near-field optical microscopy

  • H. Heinzelmann
  • D. W. Pohl
Scanning Probe Methods In Materials Science (Part II)

DOI: 10.1007/BF00332200

Cite this article as:
Heinzelmann, H. & Pohl, D.W. Appl. Phys. A (1994) 59: 89. doi:10.1007/BF00332200

Abstract

Scanning Near-field Optical Microscopy (SNOM) allows the investigation of optical properties on subwavelength scales. During the past few years, more and more attention has been given to this technique that shows enormous potential for imaging, sensing and modification at near-molecular resolution. This article describes the technique and reviews recent progress in the field.

PACS

61.16.Ch

Copyright information

© Springer-Verlag 1994

Authors and Affiliations

  • H. Heinzelmann
    • 1
    • 2
  • D. W. Pohl
    • 2
  1. 1.Institut für PhysikUniversität BaselBaselSwitzerland
  2. 2.IBM Research LaboratoryRüschlikonSwitzerland