Applied Physics A

, Volume 57, Issue 1, pp 105–107

Excimer-laser-induced electric conductivity in thin-film C60

  • H. M. Phillips
  • D. Sarkar
  • N. J. Halas
  • R. H. Hauge
  • R. Sauerbrey
Rapid Communication

DOI: 10.1007/BF00331226

Cite this article as:
Phillips, H.M., Sarkar, D., Halas, N.J. et al. Appl. Phys. A (1993) 57: 105. doi:10.1007/BF00331226

Abstract

The electrical conductivity of thin-film C60 has been changed by more than seven orders of magnitude with KrF (248nm) excimer-laser irradiation. Specific conductivities of 1 Ω−1 · cm−1 have been obtained. The onset of conductivity is consistent with a laser-induced metal-insulator phase transition. The threshold for KrF-laser ablation of C60 has been determined to be 20±2 mJ/cm2. This laser-induced process generates an all-carbon semiconductor-metallic junction which may have important technological applications.

PACS

73.61.Ph 78.66.Qn 81.40.Rs 

Copyright information

© Springer-Verlag 1993

Authors and Affiliations

  • H. M. Phillips
    • 1
  • D. Sarkar
    • 1
  • N. J. Halas
    • 1
  • R. H. Hauge
    • 2
  • R. Sauerbrey
    • 1
  1. 1.Department of Electrical and Computing EngineeringRice UniversityHoustonUSA
  2. 2.Department of Chemistry and the Rice Quantum InstituteRice UniversityHoustonUSA