Quantitative depth-profiling with GDOS: application to ZnNi-electrogalvanized steel sheets
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- Angeli, J., Kaltenbrunner, T. & Androsch, F.M. Fresenius J Anal Chem (1991) 341: 140. doi:10.1007/BF00322125
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Studies are made on quantitative GDOS depth profile analysis for ZnNi-coatings. Relative and absolute depth resolution on the interface ZnNi-coating/steel substrate were evaluated in a thickness range of 0.5 to 5 μm using two different anode tube diameters. For quantification, an improved approach of the model of constant emission yield was established. The results are demonstrated on ZnNi-electrodeposits with different coating thickness and chemical content.