Fresenius' Journal of Analytical Chemistry

, Volume 341, Issue 1, pp 140–144

Quantitative depth-profiling with GDOS: application to ZnNi-electrogalvanized steel sheets

Authors

  • J. Angeli
    • VOEST-ALPINE STAHL LINZ GmbH, Research, Development and Testing Techniques
  • T. Kaltenbrunner
    • VOEST-ALPINE STAHL LINZ GmbH, Research, Development and Testing Techniques
  • F. M. Androsch
    • VOEST-ALPINE STAHL LINZ GmbH, Research, Development and Testing Techniques
Part I Metals And Metallic Compounds

DOI: 10.1007/BF00322125

Cite this article as:
Angeli, J., Kaltenbrunner, T. & Androsch, F.M. Fresenius J Anal Chem (1991) 341: 140. doi:10.1007/BF00322125

Summary

Studies are made on quantitative GDOS depth profile analysis for ZnNi-coatings. Relative and absolute depth resolution on the interface ZnNi-coating/steel substrate were evaluated in a thickness range of 0.5 to 5 μm using two different anode tube diameters. For quantification, an improved approach of the model of constant emission yield was established. The results are demonstrated on ZnNi-electrodeposits with different coating thickness and chemical content.

Copyright information

© Springer-Verlag 1991