Physics and Chemistry of Minerals

, Volume 16, Issue 8, pp 741–746

Dielectric constants of BeO, MgO, and CaO using the two-terminal method

  • M. A. Subramanian
  • R. D. Shannon
  • B. H. T. Chai
  • M. M. Abraham
  • M. C. Wintersgill
Article

DOI: 10.1007/BF00209695

Cite this article as:
Subramanian, M.A., Shannon, R.D., Chai, B.H.T. et al. Phys Chem Minerals (1989) 16: 741. doi:10.1007/BF00209695
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Abstract

Using fused SiO2, CaF2, and SrF2 samples with accurately known dielectric constants, we have evaluated the accuracy and precision of two-terminal dielectric constant measurements on small single crystals using empirically determined edge corrections. Values of κ′ at 1 MHz of 3.836±0.05 for silica, 6.814±0.07 for CaF2 and 6.463±0.09 for SrF2 indicate an accuracy and precision of 1.0–1.5% for samples having areas of 0.05–1.0 cm2. Dielectric constants of BeO, MgO, and CaO measured by this technique are: BeO, κ′a=6.87 and κ′c=7.74; MgO, κ′= 9.90; and CaO, κ′=11.95 where κ′a and κ′c are the dielectric constants parallel to the a and c axes, respectively. Dielectric loss measurements on CaO in vacuum between 5–400 K at 10–105 Hz indicate significant dispersion at temperatures higher than 300 K, but the effect of the losses on the dielectric constant is less than 1% at 1 MHz and 300 K.

Copyright information

© Springer-Verlag 1989

Authors and Affiliations

  • M. A. Subramanian
    • 1
  • R. D. Shannon
    • 1
  • B. H. T. Chai
    • 2
  • M. M. Abraham
    • 1
  • M. C. Wintersgill
    • 3
  1. 1.Central Research and Development DepartmentE.I. du Pont de Nemours & Co., Inc.WilmingtonUSA
  2. 2.Allied Corporation, Corporate HeadquartersMorristownUSA
  3. 3.United States Naval AcademyAnnapolisUSA