Journal of Electronic Testing

, Volume 9, Issue 1, pp 59–73

Optimization-based multifrequency test generation for analog circuits

Authors

  • A. Abderrahman
    • Département de Génie Électrique et d'InformatiqueEcole Polytechnique de Montréal
  • B. Kaminska
    • Département de Génie Électrique et d'InformatiqueEcole Polytechnique de Montréal
  • E. Cerny
    • Département d'Informatique et de Recherche OpérationnelleUniversité de Montréal
Article

DOI: 10.1007/BF00137565

Cite this article as:
Abderrahman, A., Kaminska, B. & Cerny, E. J Electron Test (1996) 9: 59. doi:10.1007/BF00137565

Abstract

A robust test set for analog circuits has to detect faults under maximal masking effects due to variations of circuit parameters in their tolerance box. In this paper we propose an optimization based multifrequency test generation method for detecting parametric faults in linear analog circuits. Given a set of performances and a frequency range, our approach selects the test frequencies that maximize the observability on a circuit performance of a parameter deviation under the worst masking effects of normal variations of the other parameters. Experimental results are provided and validated by HSpice simulations to illustrate the proposed approach.

Keywords

multifrequency test generationparametric faultstolerance effectsfault observability maximization

Copyright information

© Kluwer Academic Publishers 1996