Abstract
The 25-year history and development of an ultra-small-angle X-ray scattering (USAXS) instrument dedicated to serving materials research is presented and discussed. The instrument’s successful track record is attributed to three factors. The first, and surely the most important, is that all development has been driven by scientific research directions and opportunities. Second, the USAXS instrument is a core capability rather than an add-on facility, with measurement capability from micrometers to nanometers, which is precisely the size range where microstructures determine physical properties. The third is that the instrument’s range of capabilities has continually expanded, now including 2D collimation, imaging, and dynamics. And finally, USAXS has enjoyed the benefit of a management structure that has consistently appreciated the unique experimental measurement capabilities that USAXS delivers.
Notes
Certain commercial equipment, instruments, software, or materials are identified in this article to foster understanding. Such identification does not imply recommendation or endorsement by the Department of Commerce, nor does it imply that the materials or equipment identified are necessarily the best available for the purpose.
References
I. Fankuchen and M.H. Jellinek: Phys. Rev., 1945, vol. 67, p. 201.
M.H. Jellinek and I. Fankuchen: Ind. Eng. Chem., 1949, vol. 41, pp. 2259–65.
U. Bonse and M. Hart: Appl. Phys. Lett., 1965, vol. 7, pp. 238–40.
T. Narayanan, O. Diat, and P. Bosecke: Nucl. Instrum. Methods, 2001, vol. 467, pp. 1005–09.
M. Sztucki, J. Gorini, J.-P. Vassalli, L. Goirand, P. van Vaerenbergh, and T. Narayanan: J. Synchrotron Radiat., 2008, vol. 15, pp. 341–49.
J.G. Barker, C.J. Glinka, J.J. Moyer, M.H. Kim, A.R. Drews, and M. Agamalian: J. Appl. Crystallogr., 2005, vol. 38, pp. 1004–11.
J.M. Carpenter, M. Agamalian, K.C. Littrell, P. Thiyagarajan, and C. Rehm: J. Appl. Crystallogr. 2003, vol. 36, pp. 763–68.
P.R. Jemian: Characterization of Steels by Anomalous Small-Angle X-ray Scattering, Northwestern University, Evanston, IL, 1990.
J. Ilavsky and P.R. Jemian: J. Appl. Crystallogr., 2009, vol. 42, pp. 347–53.
G.G. Long, P.R. Jemian, J.R. Weertman, D.R. Black, H.E. Burdette, and R. Spal: J. Appl. Crystallogr., 1991, vol. 24, pp. 30–37.
P.R. Jemian and G.G. Long: J. Appl. Crystallogr., 1990, vol. 23, pp. 430–32.
G.G. Long and L.E. Levine: Acta Crystallogr. A, 2005, vol. 61, pp. 557–67.
P.R. Jemian, G.G. Long, F. Lofaj, and S.M. Wiederhorn: in Applications of Synchrotron Radiation Techniques to Materials Science V, S.R. Stock, S.M. Mini, and D.L. Perry, eds., MRS, Pittsburgh, 2000, pp. 131–36.
E.A. Mendoza, D. Sunil, E. Wolkow, H.D. Gafney, M.H. Rafailovich, J. Sokolov, G.G. Long, P.R. Jemian, S.A. Schwartz, and B.J. Wilkens: Appl. Phys. Lett., 1990, vol. 57, pp. 209–11.
M. Goldman, R. Gronsky, G.G. Long, and L. Pruitt: Polym. Degrad. Stab., 1998, vol. 62, pp. 97–104.
G. Beaucage, S. Rane, D.W. Schaefer, G. Long, and D. Fischer: J. Polym. Sci. B, 1999, vol. 37, pp. 1105–119.
G.G. Long, S. Krueger, P.R. Jemian, D.R. Black, H.E. Burdette, J.P. Cline, and R.A. Gerhardt: J. Appl. Crystallogr., 1990, vol. 23, pp. 535–44.
A. Braun, J. Ilavsky, B.C. Dunn, P.R. Jemian, F.E. Huggins, E.M. Eyring, and G.P. Huffman: J. Appl. Crystallogr., 2005, vol. 38, pp. 132–38.
F. Lofaj, S.M. Wiederhorn, G.G. Long, B.J. Hockey, P.R. Jemian, L. Browder, J. Andreason, and U. Taffner: J. Eur. Ceram. Soc., 2002, vol. 22, pp. 2479–87.
J. Ilavsky, G.G. Long, A.J. Allen, and C.C. Berndt: Mater. Sci. Eng. A, 1999, vol. 272, pp. 215–21.
A.J. Allen, J. Ilavsky, and A. Braun: Adv. Eng. Mater., 2009, vol. 11, pp. 495–501.
T.M. Willey, T. van Buuren, J.R.I. Lee, G.E. Overturf, J.H. Kinney, J. Handly, B.L. Weeks, and J. Ilavsky: Propellants Explos. Pyrotech., 2006, vol. 31, pp. 466–71.
G.G. Long, L.E. Levine, and R. Thomson: J. Appl. Crystallogr., 2000, vol. 33, pp. 456–60.
A.J. Allen, V.A. Hackley, P.R. Jemian, J. Ilavsky, J.M. Raitano, and S.W. Chan: J. Appl. Crystallogr., 2008, vol. 41, pp. 918–29.
X.A. Pan, X.L. Wu, K. Mo, X.A. Chen, J. Almer, J. Ilavsky, D.R. Haeffner, and J.F. Stubbins: J. Nucl. Mater., 2010, vol. 407, pp. 10–15.
F. Zhang, G.G. Long, P.R. Jemian, J. Ilavsky, V.T. Milam, and J.A. Lewis: Langmuir, 2008, vol. 24, pp. 6504–08.
J. Ilavsky, A.J. Allen, G.G. Long, and P.R. Jemian: Rev. Sci. Instrum., 2002, vol. 73, pp. 1660–62.
L.E. Levine and G.G. Long: J. Appl. Crystallogr., 2004, vol. 37, pp. 757–65.
A.A. Kulkarni, A. Goland, H. Herman, A.J. Allen, J. Ilavsky, G.G. Long, C.A. Johnson, and J.A. Ruud: J. Am. Ceram. Soc., 2004, vol. 87, pp. 1294–1300.
F. Zhang, G.G. Long, L.E. Levine, J. Ilavsky, and P.R. Jemian: J. Appl. Crystallogr., 2008, vol. 41, pp. 416–27.
F. Zhang, A.J. Allen, L.E. Levine, J. Ilavsky, G.G. Long, and A.R. Sandy: J. Appl. Crystallogr., 2011, vol. 44, pp. 200–12.
F. Zhang, A.J. Allen, L. Levine, J. Ilavsky, and G. Long: Metall. Mater. Trans. A, 2012, vol. 43A, pp. 1445–53.
J. Ilavsky, P.R. Jemian, A.J. Allen, F. Zhang, L.E. Levine, and G.G. Long: J. Appl. Crystallogr., 2009, vol. 42, pp. 469–79.
J.A. Lake: Acta Crystallogr., 1967, vol. 23, pp. 191–94.
F. Zhang and J. Ilavsky: Polym. Rev., 2010, vol. 50, pp. 59–90.
F. Zhang, J. Ilavsky, G.G. Long, J.P.G. Quintana, A.J. Allen, and P.R. Jemian: Metall. Mater. Trans. A, 2010, vol. 41A, pp. 1151–58.
J. Ilavsky: J. Appl. Crystallogr., 2012, vol. 45, pp. 324–28.
A.J. Allen, P.R. Jemian, D.R. Black, H.E. Burdette, R.D. Spal, S. Krueger, and G.G. Long: Nucl. Instrum. Methods Phys. Res. A, 1994, vol. 347, pp. 487–90.
G. Beaucage, H.K. Kammler, R. Mueller, R. Strobel, N. Agashe, S.E. Pratsinis, and T. Narayanan: Nat. Mater., 2004, vol. 3, pp. 370–74.
H.K. Kammler, G. Beaucage, R. Mueller, and S.E. Pratsinis: Langmuir, 2004, vol. 20, pp. 1915–21.
J. Zhao, D.W. Schaefer, D.L. Shi, J. Lian, J. Brown, G. Beaucage, L.M. Wang, and R.C. Ewing: J. Phys. Chem. B, 2005, vol. 109, pp. 23351–57.
J. Ilavsky: J. Therm. Spray Technol., 2010, vol. 19, pp. 178–89.
A. Kulkarni, Z. Wang, T. Nakamura, S. Sampath, A. Goland, H. Herman, A.J. Allen, J. Ilavsky, G. Long, J. Frahm, and R.W. Steinbrech: Acta Mater., 2003, vol. 51, pp. 2457–75.
A.F. Renteria, B. Saruhan, J. Ilavsky, and A.J. Allen: Surf. Coat. Technol., 2007, vol. 201, pp. 4781–88.
P. Fauchais, V. Rat, J.F. Coudert, R. Etchart-Salas, and G. Montavon: Surf. Coat. Technol., 2008, vol. 202, pp. 4309–17.
A. Bacciochini, F. Ben-Ettouil, E. Brousse, J. Ilavsky, G. Montavon, A. Denoirjean, S. Valette, and P. Fauchais: Surf. Coat. Technol., 2010, vol. 205, pp. 683–689.
A. Bacciochini, G. Montavon, J. Ilavsky, A. Denoirjean, and P. Fauchais: J. Therm. Spray Technol., 2009, vol. 19, pp. 198–206.
F. Zhang, A.J. Allen, L.E. Levine, L. Espinal, J.M. Antonucci, S. Drago, J.N.R. O’Donnell, and J. Ilavsky: J. Biomed. Mater. Res. A, 2012, vol. 100A, pp. 1293–1306.
Acknowledgments
The critical support and advice in the early years from Professors Julia R. Weertman and the late Jerry B. Cohen, both of Northwestern University, are gratefully acknowledged, as well as the help and discussions with John G. Barker of Northwestern University (now at NIST) and David R. Black and Richard D. Spal of NIST. The authors thank NSLS at Brookhaven National Lab. for hosting the USAXS instrument at sector X23 until 1999. At the APS, the former UNICAT consortium members, Oak Ridge National Lab., the University of Illinois at Urbana-Champagne, and UOP LLC., are thanked for welcoming NIST to UNICAT and hosting the USAXS instrument at sector 33-ID from 1999 until 2006. The APS X-ray Science Division (XSD) is thanked for hosting the USAXS instrument at sector 32-ID from 2006 until 2010. The hosting of the USAXS instrument at APS sector 15-ID from 2010 to the present day by XSD, in partnership with the University of Chicago’s ChemMatCARS, is gratefully acknowledged. The authors thank the beamline and facility staff, and our many users and collaborators who have contributed to the success of the USAXS instrument over its 25-year history. The use of the NSLS was supported by the U.S. Department of Energy (DoE) under contract no. DE-AC02-98CH10886. The use of the Advanced Photon Source, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science by Argonne National Laboratory, is supported by the U.S. DOE under Contract No. DEAC02-06CH11357. ChemMatCARS Sector 15 is principally supported by the National Science Foundation/Department of Energy under grant number NSF/CHE-0822838.
Author information
Authors and Affiliations
Corresponding author
Additional information
Manuscript submitted April 15, 2012.
Rights and permissions
About this article
Cite this article
Ilavsky, J., Zhang, F., Allen, A.J. et al. Ultra-Small-Angle X-ray Scattering Instrument at the Advanced Photon Source: History, Recent Development, and Current Status. Metall Mater Trans A 44, 68–76 (2013). https://doi.org/10.1007/s11661-012-1431-y
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11661-012-1431-y