Abstract
The effect of grain size and deformation temperature on the behavior of wire-drawn α-Ti during compression has been examined. At strains of 0.3, the flow stress exhibited a negative Hall–Petch slope. This is proposed to result from the prevalence of twinning during the compressive deformation. Electron backscattered diffraction revealed that \( \{ 10\ifmmode\expandafter\bar\else\expandafter\=\fi{1}2\} \) was the most prolific twin type across all the deformation temperatures and grain sizes examined. Of the twinning modes observed, \( \{ 11\ifmmode\expandafter\bar\else\expandafter\=\fi{2}2\} \) twinning was the most sensitive to the grain size and deformation temperature. The range of morphologies exhibited by deformation twins is also described.
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Acknowledgments
The work described in this article was funded by the Australian Research Council through the Centre of Excellence in Light Metals. The assistance of Ms. Zohreh Keshavarz, Ms. Katrina Morgans, and Dr. Andrew Sullivan with the experimental work is also gratefully acknowledged.
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Manuscript submitted June 26, 2007.
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Stanford, N., Carlson, U. & Barnett, M. Deformation Twinning and the Hall–Petch Relation in Commercial Purity Ti. Metall Mater Trans A 39, 934–944 (2008). https://doi.org/10.1007/s11661-007-9442-9
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DOI: https://doi.org/10.1007/s11661-007-9442-9