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Thermal lensing, thermal management and transverse mode control in microchip VECSELs

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Abstract

Finite-element analysis is used to explore the practicalities and power-scaling potential of quasi-monolithic microchip vertical-external-cavity surface-emitting lasers: thermal lensing and its implications for transverse mode control are emphasised. A comparison is made between the use of sapphire and diamond heat spreaders. The experimental characterisation of an InGaAs/sapphire microchip VECSEL is presented as an exemplar system and the factors affecting slope efficiency, threshold and output power roll-over are examined. By comparing experimental measurements with the finite-element model, the key role of thermal lensing in transverse mode control is demonstrated.

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Authors and Affiliations

  1. Institute of Photonics, University of Strathclyde, 106 Rottenrow, Glasgow, G4 0NW, Scotland, UK

    A.J. Kemp, A.J. Maclean, J.E. Hastie, S.A. Smith, J.-M. Hopkins, S. Calvez, G.J. Valentine, M.D. Dawson & D. Burns

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  1. A.J. Kemp
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  2. A.J. Maclean
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  3. J.E. Hastie
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  4. S.A. Smith
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  5. J.-M. Hopkins
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  6. S. Calvez
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  7. G.J. Valentine
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  8. M.D. Dawson
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  9. D. Burns
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Correspondence to A.J. Kemp.

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PACS

42.55.Xi; 42.55.Rz; 42.55.Px

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Kemp, A., Maclean, A., Hastie, J. et al. Thermal lensing, thermal management and transverse mode control in microchip VECSELs. Appl. Phys. B 83, 189–194 (2006). https://doi.org/10.1007/s00340-006-2151-z

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  • DOI: https://doi.org/10.1007/s00340-006-2151-z

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