Abstract.
A silicon bent perfect crystal in fully asymmetric diffraction (FAD) geometry in combination with a linear position-sensitive detector can be effectively used for high-resolution analysis of a beam scattered by a sample. The results of the first promising time of flight (TOF) experimental tests of λ scanning carried out with the FAD of cylindrically bent Si slabs of different cuts are presented. The length and the homogeneous curvature of the crystal determine the range of Δλ/λ of about 10-2 that could be investigated with the accuracy of δk/k≈10-4. The obtained experimental results indicate that the FAD geometry of the bent Si slab in combination with a one-dimensional position-sensitive detector could be a good candidate for a high-resolution analyzer at some of the TOF instruments.
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Received: 1 June 2001 / Accepted: 12 March 2002
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Mikula, P., Furusaka, M., Haryo, S. et al. On the possibility of using bent perfect crystals in TOF neutron scattering devices . Appl Phys A 74 (Suppl 1), s207–s209 (2002). https://doi.org/10.1007/s003390201732
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DOI: https://doi.org/10.1007/s003390201732