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Molecular mapping of two loci that confer resistance to Asian rust in soybean

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Abstract

Asian soybean rust (ASR) is caused by the fungal pathogen Phakopsora pachyrhizi Sydow & Sydow. It was first identified in Brazil in 2001 and quickly infected soybean areas in several countries in South America. Primary efforts to combat this disease must involve the development of resistant cultivars. Four distinct genes that confer resistance against ASR have been reported: Rpp1, Rpp2, Rpp3, and Rpp4. However, no cultivar carrying any of those resistance loci has been released. The main objective of this study was to genetically map Rpp2 and Rpp4 resistance genes. Two F2:3 populations, derived from the crosses between the resistant lines PI 230970 (Rpp2), PI 459025 (Rpp4) and the susceptible cultivar BRS 184, were used in this study. The mapping populations and parental lines were inoculated with a field isolate of P. pachyrhizi and evaluated for lesion type as resistant (RB lesions) or susceptible (TAN lesions). The mapping populations were screened with SSR markers, using the bulk segregant analysis (BSA) to expedite the identification of linked markers. Both resistance genes showed an expected segregation ratio for a dominant trait. This study allowed mapping Rpp2 and Rpp4 loci on the linkage groups J and G, respectively. The associated markers will be of great value on marker assisted selection for this trait.

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Acknowledgments

This study was partly supported by Japan International Research Center for Agricultural Sciences (JIRCAS) international project (Identification of Stable Resistance to Soybean Rust for South America), National Council for Scientific and Technological Development (CNPq) and Studies and Projects Financing Entity (FINEP). Approved for publication by the editorial board of Embrapa Soybean as manuscript 12/2007.

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Authors and Affiliations

  1. Brazilian Agricultural Research Corporation—Embrapa Soybean, Caixa Postal 231, 86001-970, Londrina, PR, Brazil

    Danielle C. G. Silva, Naoki Yamanaka, Rodrigo L. Brogin, Carlos A. A. Arias, Alexandre L. Nepomuceno, Selma S. Pereira, Livia M. Nogueira, André L. L. Passianotto & Ricardo V. Abdelnoor

  2. Japan International Research Center for Agricultural Sciences—JIRCAS, 1-1, Ohwashi, Tsukuba, Ibaraki, 305-8686, Japan

    Naoki Yamanaka

  3. Faculties Luiz Meneghel, University of North Paraná—FALM-UENP, Rodovia BR 369, Km 54, Caixa Postal 261, 86360-000, Bandeirantes, PR, Brazil

    Danielle C. G. Silva, Selma S. Pereira, Livia M. Nogueira & André L. L. Passianotto

  4. São Paulo State University—UNESP, Jaboticabal, 14884-900, Jaboticabal, SP, Brazil

    Danielle C. G. Silva & Antônio O. Di Mauro

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  1. Danielle C. G. Silva
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  2. Naoki Yamanaka
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  3. Rodrigo L. Brogin
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  6. Antônio O. Di Mauro
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  7. Selma S. Pereira
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  8. Livia M. Nogueira
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  9. André L. L. Passianotto
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  10. Ricardo V. Abdelnoor
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Corresponding author

Correspondence to Ricardo V. Abdelnoor.

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Communicated by D. A. Lightfoot.

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Silva, D.C.G., Yamanaka, N., Brogin, R.L. et al. Molecular mapping of two loci that confer resistance to Asian rust in soybean. Theor Appl Genet 117, 57–63 (2008). https://doi.org/10.1007/s00122-008-0752-0

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  • DOI: https://doi.org/10.1007/s00122-008-0752-0

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