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  • © 2002

Materials & Process Integration for MEMS

Part of the book series: Microsystems (MICT, volume 9)

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Table of contents (14 chapters)

  1. Front Matter

    Pages N3-xix
  2. Integration of Piezoelectric Pb(ZrxTi1-x)O3 (PZT) Thin Films into Micromachined Sensors and Actuators

    • Paul Muralt, Nicolas Ledermann, Jacek J. Baborowski, Sandrine Gentil
    Pages 1-24
  3. GaAs Cantilever and Bridge Membrane-Like Structures Fully Compatible with AlGaAs/InGaAs/GaAs and InGaP/InGaAs/GaAs Based HFETs

    • T. Lalinsky, M. Drzik, L. Matay, I. Kostic, Z. Mozolova, S. Hascik et al.
    Pages 51-75
  4. Chemically Amplified Resist for Micromachining Using X-Ray Lithography

    • T. L. Tan, V. A. Kudryashov, B. L. Tan
    Pages 97-111
  5. Self-Assembled Monolayers (SAM) for Tunneling Sensors

    • Francis E. H. Tay, S. J. O’Shea, Andrew T. S. Wee, Poh Chong Lim, Andojo Ongkodjojo
    Pages 113-132
  6. Oxidation Process-Optimization for Large Area Silicon Fusion Bonded Devices and MEMS Structures

    • K. N. Bhat, N. DasGupta, A. DasGupta, P. R. S. Rao, R. Navin Kumar, Y. Chandana
    Pages 133-156
  7. Silicon Nanomachining by Scanning Probe Lithography and Anisotropic Wet Etching

    • J. T. Sheu, H. T. Chou, W. L. Cheng, C. H. Wu, L. S. Yeou
    Pages 157-174
  8. A Novel Bulk Micromachining Method in Gallium Arsenide

    • Dong-il Dan Cho, Jongpal Kim, Setae Kim, Sangjun Park, Seung-Joon Paik, Chiwan Ku et al.
    Pages 175-184
  9. Spray Coating Technology of Photoresist/Polymer for 3-D Patterning and Interconnect

    • Arief Budiman Suriadi, Vineet Sharma, Bernhard Wieder, Gerald Mittendorfer
    Pages 203-229
  10. Tactical Grade MEMS Gyroscopes Fabricated by the SBM Process

    • Dong-il Dan Cho, Sangjun Park, Jongpal Kim, Sangchul Lee, Sang Woo Lee
    Pages 257-272
  11. Plasma Etching Techniques to Form High-Aspect-Ratio MEMS Structures

    • Won Jong Yoo, Kitt Wai Kok, Say Yong Koh
    Pages 273-294
  12. Back Matter

    Pages 295-299

About this book

The field of materials and process integration for MEMS research has an extensive past as well as a long and promising future. Researchers, academicians and engineers from around the world are increasingly devoting their efforts on the materials and process integration issues and opportunities in MEMS devices. These efforts are crucial to sustain the long-term growth of the MEMS field. The commercial MEMS community is heavily driven by the push for profitable and sustainable products. In the course of establishing high­ volume and low-cost production processes, the critical importance of materials properties, behaviors, reliability, reproducibility, and predictability, as well as process integration of compatible materials systems become apparent. Although standard IC fabrication steps, particularly lithographic techniques, are leveraged heavily in the creation of MEMS devices, additional customized and novel micromachining techniques are needed to develop sophisticated MEMS structures. One of the most common techniques is bulk micromachining, by which micromechanical structures are created by etching into the bulk of the substrates with either anisotropic etching with strong alk:ali solution or deep reactive-ion etching (DRIB). The second common technique is surface micromachining, by which planar microstructures are created by sequential deposition and etching of thin films on the surface of the substrate, followed by a fmal removal of sacrificial layers to release suspended structures. Other techniques include deep lithography and plating to create metal structures with high aspect ratios (LIGA), micro electrodischarge machining (J.

Editors and Affiliations

  • The National University of Singapore, Singapore

    Francis E. H. Tay

Bibliographic Information

  • Book Title: Materials & Process Integration for MEMS

  • Editors: Francis E. H. Tay

  • Series Title: Microsystems

  • DOI: https://doi.org/10.1007/978-1-4757-5791-0

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media New York 2002

  • Hardcover ISBN: 978-1-4020-7175-1Published: 31 August 2002

  • Softcover ISBN: 978-1-4419-5303-2Published: 03 December 2010

  • eBook ISBN: 978-1-4757-5791-0Published: 29 June 2013

  • Series ISSN: 1389-2134

  • Edition Number: 1

  • Number of Pages: XIX, 299

  • Topics: Characterization and Evaluation of Materials, Classical Mechanics

Buy it now

Buying options

eBook USD 129.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access