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Integrated Circuit Defect-Sensitivity: Theory and Computational Models

  • Book
  • © 1993

Overview

Authors:
  1. José Pineda Gyvez

    1. Texas A&M University, USA

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Part of the book series: The Springer International Series in Engineering and Computer Science (SECS, volume 208)

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Table of contents (8 chapters)

  1. Front Matter

    Pages i-xxiv
    Download chapter PDF

  2. Introduction

    • José Pineda de Gyvez
    Pages 1-6

  3. Defect Semantics and Yield Modeling

    • José Pineda de Gyvez
    Pages 7-27

  4. Computational Models for Defect-Sensitivity

    • José Pineda de Gyvez
    Pages 29-47

  5. Single Defect Multiple Layer (SDML) Model

    • José Pineda de Gyvez
    Pages 49-78

  6. Fault Analysis and Multiple Layer Critical Areas

    • José Pineda de Gyvez
    Pages 79-91

  7. Single Defect Single Layer (SDSL) Model

    • José Pineda de Gyvez
    Pages 93-108

  8. IC Yield Prediction and Single Layer Critical Areas

    • José Pineda de Gyvez
    Pages 109-124

  9. Single vs. Multiple Layer Critical Areas

    • José Pineda de Gyvez
    Pages 125-136

  10. Back Matter

    Pages 137-167
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Keywords

About this book

The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's). Those fabrication plants would be concentrated with only a few market leaders.

Authors and Affiliations

  • Texas A&M University, USA

    José Pineda Gyvez

Bibliographic Information

  • Book Title: Integrated Circuit Defect-Sensitivity: Theory and Computational Models

  • Authors: José Pineda Gyvez

  • Series Title: The Springer International Series in Engineering and Computer Science

  • DOI: https://doi.org/10.1007/978-1-4615-3158-6

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media New York 1993

  • Hardcover ISBN: 978-0-7923-9306-1Published: 31 December 1992

  • Softcover ISBN: 978-1-4613-6383-5Published: 23 February 2014

  • eBook ISBN: 978-1-4615-3158-6Published: 27 November 2013

  • Series ISSN: 0893-3405

  • Edition Number: 1

  • Number of Pages: XXIV, 167

  • Number of Illustrations: 48 b/w illustrations

  • Topics: Electrical Engineering

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