Authors:
- First book to present complete, state-of-the-art coverage of dynamic fault memory testing
- Presents content using a "bottom-up" approach, from the electrical causes of malfunction up to the generation of smart test strategies
- Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.)
- Includes Spice simulation files and an SRAM logic fault simulator
- Includes supplementary material: sn.pub/extras
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Table of contents (8 chapters)
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Front Matter
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Back Matter
About this book
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.
Authors and Affiliations
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de Robotique de Microélectronique de, LIRMM - Laboratoire d'Informatique, Montpellier, France
Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Bibliographic Information
Book Title: Advanced Test Methods for SRAMs
Book Subtitle: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Authors: Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
DOI: https://doi.org/10.1007/978-1-4419-0938-1
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer-Verlag US 2010
Hardcover ISBN: 978-1-4419-0937-4Published: 04 November 2009
Softcover ISBN: 978-1-4899-8314-5Published: 03 September 2014
eBook ISBN: 978-1-4419-0938-1Published: 08 October 2009
Edition Number: 1
Number of Pages: XV, 171
Topics: Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design