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Measurements of the X-Ray Line Spectrum of a Micropinch Source by a High-Sensitive Track Detector

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Abstract

The efficiency of the diffusion chamber as a tool for diagnostics of pulsed high-temperature plasma in a single discharge is demonstrated. Creation of a diffusion chamber operating at a temperature exceeding the temperature of the ambient medium will make it possible to simplify the device design and operation. Based on the experimental data obtained with the help of the diffusion chamber by means of diffraction spectroscopy, a hypothesis is put forward on the advanced development of electron acceleration processes compared to the process of micropinch plasma decay caused by anomalous plasma heating.

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Authors and Affiliations

  1. Dukhov All-Russia Research Institute of Automatics, 127055, Moscow, Russia

    A. N. Dolgov & D. E. Prokhorovich

  2. National Research Nuclear University “MEPhI”, 115409, Moscow, Russia

    N. A. Klyachin

Authors
  1. A. N. Dolgov
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  2. N. A. Klyachin
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  3. D. E. Prokhorovich
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Corresponding author

Correspondence to N. A. Klyachin.

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Translated by A. Nikol’skii

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Dolgov, A.N., Klyachin, N.A. & Prokhorovich, D.E. Measurements of the X-Ray Line Spectrum of a Micropinch Source by a High-Sensitive Track Detector. Plasma Phys. Rep. 45, 650–656 (2019). https://doi.org/10.1134/S1063780X19060035

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  • DOI: https://doi.org/10.1134/S1063780X19060035

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