Abstract
The formation of thin organic films of copper phthalocyanine (CuPc) deposited onto the surface of gold-coated quartz crystal resonator was studied in situ under ultrahigh vacuum conditions by means of total electron-beam-induced current spectroscopy in combination with deposit thickness determination by piezocrystal microbalance technique. Variations in the fine structure of the total current spectra of CuPc layers of var-ious thicknesses in the 0–8 nm interval have been analyzed and the electron mean free path in thin CuPc films was determined as a function of the electron energy. For electron energies of 5.0, 7.2, 14.4, and 18.0 eV above the Fermi level, the mean free path is 6.4, 3.9, 2.6, and 2.3 nm.
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Translated from Pis’ma v Zhurnal Tekhnichesko\(\overset{\lower0.5em\hbox{$\smash{\scriptscriptstyle\smile}$}}{l} \) Fiziki, Vol. 29, No. 23, 2003, pp. 13–19.
Original Russian Text Copyright © 2003 by S. Komolov, Lazneva, A. Komolov.
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Komolov, S.A., Lazneva, É.F. & Komolov, A.S. Low-energy electron mean free path in thin films of copper phthalocyanine. Tech. Phys. Lett. 29, 974–976 (2003). https://doi.org/10.1134/1.1639446
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DOI: https://doi.org/10.1134/1.1639446