Abstract
In this paper, we present a modal data processing methodology, for reconstructing high resolution surfaces from measured slope data, over rectangular apertures. One of the primary goals is the ability to effectively reconstruct deflectometry measurement data for high resolution and freeform surfaces, such as telescope mirrors. We start by developing a gradient polynomial basis set which can quickly generate a very high number of polynomial terms. This vector basis set, called the G polynomials set, is based on gradients of the Chebyshev polynomials of the first kind. The proposed polynomials represent vector fields that are defined as the gradients of scalar functions. This method yields reconstructions that fit the measured data more closely than those obtained using conventional methods, especially in the presence of defects in the mirror surface and physical blockers/markers such as fiducials used during deflectometry measurements. We demonstrate the strengths of our method using simulations and real metrology data from the Daniel K. Inouye Solar Telescope (DKIST) primary mirror.
Similar content being viewed by others
References
18.3 Definitions. DLMF: 18.3 definitions. N.p., n.d. Web. Retrieved July 25, 2017 from http://dlmf.nist.gov/18.3.
Daniel K. Inouye solar telescope. N.p., n.d. Web. Retrieved July 31, 2017 from http://dkist.nso.edu/.
Chung, S., Song, S. E., & Cho, Y. T. (2017). Effective software solutions for 4D printing: A review and proposal. International Journal of Precision Engineering and Manufacturing., 4, 359.
Els, S., Lock, T., Comoretto, G., Gracia, G., O’Mullane, W., Cheek, N., et al. (2014). The commissioning of Gaia. Proceedings of SPIE, 9150, 91500A.
Fox, L., & Parker, J. B. (1968). Approximation. Minimax and least-squares theories. Chebyshev polynomials in numerical analysis (pp. 1–17). London: Oxford U Pr.
Franceschini, F., Galetto, M., Maisano, D., & Mastrogiacomo, L. (2014). Large-scale dimensional metrology (LSDM): From tapes and theodolites to multi-sensor systems. International Journal of Precision Engineering and Manufacturing, 15, 1739.
Jüptner, W., & Bothe, T. (2009). Sub-nanometer resolution for the inspection of reflective surfaces using white light. Proceedings of SPIE, 7405, 740502.
Kim, B. C. (2015). Development of aspheric surface profilometry using curvature method. International Journal of Precision Engineering and Manufacturing, 16, 1963.
Kim, D. W., Aftab, M., Choi, H., Graves, L., & Trumper, I. (2016). Optical metrology systems spanning the full spatial frequency spectrum, FW5G.4. Washington: Optical Society of America.
Kim, D. W., Su, P., Oh, C. J., and Burge, J. H., Extremely large freeform optics manufacturing and testing, In 2015 Conference on lasers and electro-optics pacific rim, (Optical Society of America, 2015), paper 26F1_1.
Kim, D., Su, T., Su, P., Oh, C., Graves, L., & Burge, J. (2015). Accurate and rapid IR metrology for the manufacture of freeform optics. SPIE Newsroom. https://doi.org/10.1117/2.1201506.006015.
Knauer, M. C., Kaminski, J., & Hausler, G. (2004). Phase measuring deflectometry: A new approach to measure specular free-form surfaces. Proceedings of SPIE, 5457, 366.
Li, M., Li, D., Jin, C., Yuan, X., Xiong, Z., & Wang, Q. (2017). Improved zonal integration method for high accurate surface reconstruction in quantitative deflectometry. Applied Optics, 56, F144–F151.
Li, M., Li, D., Zhang, C., Wang, Q., & Chen, H. (2015). Modal wavefront reconstruction from slope measurements for rectangular apertures. Journal of the Optical Society of America A, 32, 1916–1921.
Liu, F., Robinson, B. M., Reardon, P. J., & Geary, J. M. (2001). Analyzing optics test data on rectangular apertures using 2-D Chebyshev polynomials. Optical Engineering, 50(4), 043609–043618.
Mahajan, V. N. (2010). Orthonormal aberration polynomials for anamorphic optical imaging systems with rectangular pupils. Applied Optics, 49, 6924–6929.
Mahajan, V. N. (2013). Optical imaging and aberrations, Part III: Wavefront analysis . Bellingham: SPIE Press.
Mason, J. C., & Christopher, D. (2003). Handscomb. Chebyshev polynomials. Boca Raton: Chapman & Hall.
Oh, C., Lowman, A. E., Smith, G. A., Su, P., Huang, R., Su, T., et al. (2016). Fabrication and testing of 4.2 m off-axis aspheric primary mirror of Daniel K. Inouye solar telescope. Proceedings of SPIE Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II, 9912, 99120O.
Polidan, R. S., Breckinridge, J. B., Lillie, C. F., MacEwen, H. A., Flannery, M. R., Dailey, D. R., et al. (2015). An evolvable space telescope for future astronomical missions 2015 update. Proceedings of SPIE, 9602, 960207.
Primot, J., Rousset, G., & Fontanella, J. C. (1990). Deconvolution from wave-front sensing: A new technique for compensating turbulence-degraded images. Journal of the Optical Society of America A. Optics and Image Science, 7, 1598–1608.
Rivlin, T. J. (1974). The Chebyshev polynomials. New York: Wiley.
Smith, G. A., Lewis, B. J., Palmer, M., Kim, D. K., Loeff, A. R., & Burge, J. H. (2012). Open source data analysis and visualization software for optical engineering. Proceedings of SPIE, 8487, 84870F.
Southwell, W. H. (1980). Wave-front estimation from wave-front slope measurements. Journal of the Optical Society of America A, 70, 998–1006.
Su, T. (2014). Asphercial metrology for non-specular surfaces with the scanning long-wave optical test system . Tucson: University of Arizona (Academic).
Su, P., Khreishi, M. H., Su, T., Huang, R., Dominguez, M. Z., Maldonado, A., et al. (2013). Aspheric and freeform surfaces metrology with software configurable optical test system: A computerized reverse Hartmann test. Optical Engineering, 53(3), 031305–031316.
Su, T., Park, W. H., Parks, R. E., Su, P., & Burge, J. H. (2011). Scanning long-wave optical test system: A new ground optical surface slope test system. Proceedings of SPIE, 8126, 81260E.
Su, P., Parks, R. E., Wang, L., Angel, R. P., & Burge, J. H. (2010). Software configurable optical test system: a computerized reverse Hartmann test. Applied Optics, 49, 4404–4412.
Su, P., Wang, Y., Burge, J., Kaznatcheev, K., & Idir, M. (2012). Non-null full field X-ray mirror metrology using SCOTS: A reflection deflectometry approach. Optics Express, 20, 12393–12406.
Su, T., Wang, S., Parks, R. E., Su, P., & Burge, J. H. (2013). Measuring rough optical surfaces using scanning long-wave optical test system. 1. Principle and implementation. Applied Optics, 52, 7117–7126.
Tan, G., Zhang, L., Liu, S., & Zhang, W. (2015). A fast and differentiated localization method for complex surfaces inspection. International Journal of Precision Engineering and Manufacturing, 16, 2631.
Tang, Y., Su, X., Liu, Y., & Jing, H. (2008). 3D shape measurement of the aspheric mirror by advanced phase measuring deflectometry. Optics Express, 16, 15090–15096.
Zhao, C., & Burge, J. H. (2007). Orthonormal vector polynomials in a unit circle, part I: Basis set derived from gradients of Zernike polynomials. Optics Express, 15, 18014–18024.
Zhao, C., & Burge, J. H. (2008). Orthonormal vector polynomials in a unit circle, part II: Completing the basis set. Optics Express, 16, 6586–6591.
Zwillinger, D. (2003). Special functions. CRC standard mathematical tables and formulae (31st ed., pp. 532–538). Boca Raton: CRC.
Acknowledgements
This material is partly based on work performed for the DKIST. DKIST is managed by the National Solar Observatory, which is operated by the Association of Universities for Research in Astronomy Inc. under a cooperative agreement with the National Science Foundation. Also, it is based in part upon work performed for the “Post-processing of Freeform Optics” project supported by the Korea Basic Science Institute. The deflectometry related software development is partially funded by the II–VI Foundation Block grant.
Author information
Authors and Affiliations
Corresponding author
Ethics declarations
Conflict of interest
On behalf of all authors, the corresponding author states that there is no conflict of interest.
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Appendix
Appendix
1.1 Appendix 1
See Fig. 12.
1.2 Appendix 2
1.2.1 Orthonormality of the vector gradient polynomials
G polynomial orthogonality can be observed by noting that the dot product of two G polynomials is orthogonal:
Next, we demonstrate the G polynomials’ orthonormality using the expanded form of the polynomials (from Eq. (7)):
where \(m,\text{ }m^{{\prime }} ,\text{ }n,\) and \(n^{{\prime }}\) are integers used for indexing and \(N_{G}\) is the normalization factor, which is given by,
The proof of this derivation and details on how to obtain the normalization factor are as follows:
The first integral I1 can be expressed as:
Then, the following substitutions and subsequent equations can be used:
This integral goes to zero for all values of m and m’ (except for when \(m = m^{{\prime }}\)), since \(\sin (\pi m) = 0\) for all integer values of m. However, when \(m = m^{{\prime }}\),
Using the identity,
As before, \(\sin (2\pi m) = 0\) for all integer values of m. Thus,
Using the same substitutions as before,
Again using the trigonometric identity for the square of the sine function,
This integral equals zero for all values of n and n’, except when \(n = n^{{\prime }}\), in which case the integral is,
All of the sine terms become zero since n is an integer, so,
Similarly for I2,
Now the original integral becomes:
Next we address the cases in which either m = 0 or n = 0. When \(m = 0,\text{ }I_{1} = 0\) since,
so
where we used the fact that
Following the same steps as before,
Similarly, for n = 0,
where m and n are in the original basis in the last two equations.
It can easily be seen that I = 0 when m = 0 and n = 0.
Rights and permissions
About this article
Cite this article
Aftab, M., Burge, J.H., Smith, G.A. et al. Modal Data Processing for High Resolution Deflectometry. Int. J. of Precis. Eng. and Manuf.-Green Tech. 6, 255–270 (2019). https://doi.org/10.1007/s40684-019-00047-y
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s40684-019-00047-y