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A New Test Point Selection Method for Analog Continuous Parameter Fault

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Abstract

Discrete hard fault is always tested in existing node selection methods for analog circuit diagnosis. Actually, analog component parameter changes continuously and output node voltages distribute in a continuous voltage interval. In this paper, an novel test node selection method is proposed for continuous parameter shifting (CPS) fault. Firstly, CPS faults are sampled by parameter scan simulation in a single test frequency. Collected node voltages are seen as a data set in a statistical distribution. Secondly, ambiguous faults are identified according to the independent distributions of all CPS faults. The independence of CPS fault sample is deduced by Kruskal-Wallis non-parametric testing. Then, new fault dictionaries are generated for each test node according to ambiguous interval. The proposed fault dictionary represents the mutual independence of each pair of CPS faults. Finally, as fault dictionaries are considered as connected graphs, the optimal test nodes are selected based on an improved depth first search (DFS) algorithm. The effectiveness of method is verified by testing linear and nonlinear circuits.

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Acknowledgments

This work is supported by National Youth Natural Science Foundation of China (No. 61401215), National Natural Science Foundation of China (No. 61371041), Natural Science Youth Foundation in Jiangsu Province (No.BK20130696), Youth Science and Technology Innovation Fund of Nanjing Agricultural University (No.KJ2013041). The authors are grateful for editors and anonymous reviewers who make constructive comments.

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Authors and Affiliations

  1. College of Engineering, Nanjing Agricultural University, Nanjing, 210016, Jiangsu Province, People’s Republic of China

    Hui Luo, Wei Lu & Ling Wang

  2. College of Automation, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, Jiangsu Province, People’s Republic of China

    Youren Wang

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  1. Hui Luo
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  2. Wei Lu
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  3. Youren Wang
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  4. Ling Wang
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Correspondence to Hui Luo.

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Responsible Editor: T. Xia

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Luo, H., Lu, W., Wang, Y. et al. A New Test Point Selection Method for Analog Continuous Parameter Fault. J Electron Test 33, 339–352 (2017). https://doi.org/10.1007/s10836-017-5661-1

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  • DOI: https://doi.org/10.1007/s10836-017-5661-1

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