References
How to Avoid Produets Liability Lawsuits an Damages–Practical Guidelines for Engineers and Manufacturers. By Charles E. Witherell. 1986, Noyes Publications, Mill Road at Grand Avenue, Park Ridge, New Jersey 07656. 327 pages, hardeover, U.S. $48.00.
Reference
Semiconductors and Semimetals, Vol. 21, Hydrogenated Amorphous Silicon, Part D: Device Applications, Edited by Jacques I. Pankove. 1984, Academic Press, Inc., Orlando, Plorida 32887. 229 page, hardeover, price not given.
Reference
Electronic Properties of Materials. An Introduction for Engineers. By Rolf E. Hummel. 1985, Springer-Verlag, 175, 5th Avenue, New York, New York 10010. 319 page, hardcover, price not given.
Reference
Microstructural Science: Corrosion, Failure Analysis and Metallorgraphy. Edited by S.A. Shiels, C. Bagnall, R.E. Withowski and G.F. Vander Voort. 1985, ASM and IMS, American Society for Metals, Metals Park, Ohio. 628 page, hardcover, U.S. $66.00.
Polyacetylene: Chemistry, Physics and Materials Science. By James C.W. Chien. 1984, Academic Press, New York. 634 pages, hardcover, price not given.
Reference
Modulated Structure Materials. Edited by T. Tsakalakos. 1984, Martinus Nijhoff Publishers, P. O. Box 330, AD Dordrecht, The Nethoreland. Distributed by Kluwer Academic Publishers, 190 Old Derby Street, Highham, MA 02043, 611 page, hardcover, U.S. $79.00.
Reference
Atmospheric Deterioration of Technological Materials, A Technoclimatic Atlas, Part A: Africa, By M. Rychtera, 1985, Elsevier Science Publishing Co., Inc., P.O. Box 1663, Grand Central Station, New York, New York 10163. 225 pages, hardcover, U.S. $86.50.
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Ross, S.T., Murray, G.T., Vidali, G. et al. Book Reviews. JOM 38, 50–51 (1986). https://doi.org/10.1007/BF03257825
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DOI: https://doi.org/10.1007/BF03257825