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Materials for Energy Infrastructure pp 63–72Cite as

Imaging ToF-SIMS as a Chemical Metrology Tool to Support Material and Analytical Science

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Abstract

As a chemical metrology tool time-of-flight secondary ion mass spectrometry (ToF-SIMS) has become a very popular technique to monitor the elemental, isotopic and molecular distribution in two or three dimensions. Its reduced sampling depth, high sensitivity, great structural specificity and the direct detection of hydrogen thereby increase the emergence of ToF-SIMS for material and analytical surface science, particularly due to recent instrumental developments improving mass, depth and lateral resolution. For basic surface science, adsorption processes and surface reactivity thus can be investigated in high detail on organic as well as inorganic samples. The use of multivariate data analysis in addition can effectively assist to identify trends in the complex SIMS raw data set and define key co-variances between certain samples or mass spectra. In this contribution the essence of ToF-SIMS is illustrated by discussing two highly relevant energy applications. First, for piezoelectric electroceramics oxygen exchange active zones have been visualized to determine the impact of external field-load to the oxygen vacancy distribution between anode and cathode. As a second case study the interaction of hydrogen species with the microstructure of a duplex stainless steel was investigated. It was concluded that ToF-SIMS has a valuable essence for detailing hydrogen related degradation mechanisms.

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Author information

Authors and Affiliations

  1. BAM—Federal Institute for Materials Research and Testing, Unter Den Eichen 87, 12205, Berlin, Germany

    Gerald Holzlechner, Oded Sobol, Thomas Böllinghaus & Wolfgang Unger

Authors
  1. Gerald Holzlechner
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  2. Oded Sobol
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  3. Thomas Böllinghaus
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  4. Wolfgang Unger
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Corresponding author

Correspondence to Gerald Holzlechner .

Editor information

Editors and Affiliations

  1. National Metal and Materials Technology Center (MTEC), Pathumthani, Thailand

    Werasak Udomkichdecha

  2. National Metal and Materials Technology Center (MTEC), Pathumthani, Thailand

    Anchalee Mononukul

  3. BAM Bundesanstalt für Materialforschung und -prüfung, Berlin, Germany

    Thomas Böllinghaus

  4. BAM Bundesanstalt für Materialforschung und -prüfung, Berlin, Germany

    Jürgen Lexow

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© 2016 Springer Science+Business Media Singapore

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Holzlechner, G., Sobol, O., Böllinghaus, T., Unger, W. (2016). Imaging ToF-SIMS as a Chemical Metrology Tool to Support Material and Analytical Science. In: Udomkichdecha, W., Mononukul, A., Böllinghaus, T., Lexow, J. (eds) Materials for Energy Infrastructure. Springer, Singapore. https://doi.org/10.1007/978-981-287-724-6_7

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