Abstract
Creep and fatigue behaviors of the interconnections soldered by the lead-free Sn–Ag–Cu–Bi solder were investigated at different elevated temperatures (with the homologue temperature in the range of 0.71– 0.82), with a comparison to that of a traditional Sn60Pb40 solder. The results show that the lead-free Sn–Ag–Cu–Bi solder shows a superior anti-creep performance over the Sn60Pb40 solder, in terms of a much lower creep strain rate and a vastly elongated creep fracture lifetime; in the secondary creep regime, the calculated creep-activation energy for two solders is reasonably close to other published data. In addition, it has also been shown that the joints soldered by the lead-free Sn–Ag–Cu–Bi solder exhibits a superb fatigue property.
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Acknowledgements
This research is supported by the Ministry of Education, China, through a program of NCET (04–0824) and the matching grant, and the Natural Science Foundation of China under grants No.50471038 and 50671037.
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Zhang, X.P., Yu, C.B., Shrestha, S. et al. Creep and fatigue behaviors of the lead-free Sn–Ag–Cu–Bi and Sn60Pb40 solder interconnections at elevated temperatures. J Mater Sci: Mater Electron 18, 665–670 (2007). https://doi.org/10.1007/s10854-006-9078-3
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DOI: https://doi.org/10.1007/s10854-006-9078-3